IEC61032 IP2X IEC зонд B с круговой перегородкой 50

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IEC61032 IP2X  IEC Test Finger Probe B  with 50mm Circular baffle

Technical Parameters:

1, Knurled Finger Diameter:12mm

2, Knurled Finger Length :80mm

3, Baffle Plate Diameter :50mm

4, Baffle Plate Length : 100mm

5According to :IEC60065, IEC 60335-1, IEC 60529, IEC60884-1, IEC60950, IEC61032, IEC69745-1

 

IEC61032 IP2X  IEC Test Finger Probe B  with 50mm Circular baffle

Application:

1.The joint parts of the test finger cannot touch the live parts or hazardous parts, and the 50mm-20mm Baffle Plate cannot enter.

2.In the test requirements of preventing from approaching to the hazardous parts, the probe B test probe needs to with a 10±3N thrust. The product without force should be used with push-pull dynamometers.

3.In the test of against electric shock, wiring ,configuration and power and indicating device are needed. Turn on the power of the tested sample, and exert the corresponding force to determine whether the grounding line are connected (3 inserts).

4.Both joints shall permit movement in the same plane and the same direction through an angle of 90° with a 0° to +10° tolerance

 

 IEC61032 IP2X  IEC Test Finger Probe B  with 50mm Circular baffle 

This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

 

Tolerance on dimensions when no specific tolerance is given:

 

– on angles: 0

 

−10°
– on linear dimensions: up to 25 mm: 0

 

− 0,05 mm; over 25 mm: ± 0,2 mm.