5 в 1 источник напряжения тока измерение I/V/R блок измерения
- Категория: Test Instruments >>>
- Поставщик: Hunan,Next,Generation,Instrumental,T&c,Tech,Co.,Ltd.
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Описание и отзывы
Трекер стоимости
| Месяц | Минимальная цена | Макс. стоимость |
|---|---|---|
| Sep-19-2025 | 226.12 $* | 237.60 $* |
| Aug-19-2025 | 224.90 $* | 235.96 $* |
| Jul-19-2025 | 188.96 $* | 197.60 $* |
| Jun-19-2025 | 220.31 $* | 231.55 $* |
| May-19-2025 | 192.32 $* | 202.26 $* |
| Apr-19-2025 | 217.5 $* | 228.54 $* |
| Mar-19-2025 | 215.57 $* | 226.8 $* |
| Feb-19-2025 | 213.25 $* | 224.11 $* |
| Jan-19-2025 | 211.81 $* | 222.46 $* |
Характеристики
Product Description
The price is for reference only. Please subject to our formal quotation.
N2600 series is a digital source meter developed by NGI, which closely combines the functions of high-accuracy source and high-accuracy measurement. It integrates 5 functions (voltage source, current source, I/V/R measurement) in one instrument. The measurement range covers 200V to 1μV, 1A to 10pA, 200MΩ to 10μΩ. The measurement resolution is 6½ digits. The basic accuracy can reach 100μV, 600pA, 300μΩ. N2600 series has built-in constant voltage source, constant current source, resistance measurement, sweep mode, signal generator, synchronous trigger, function calculator, etc., and provides PC application software for free. It can be widely used in characteristic analysis and production testing of components and modules in communication, semiconductor, computer, automotive and medical industries.Application Fields
Nanomaterial and device Semiconductor assembly test
- Graphene - Diode, Zener diode, LED, laser diode
- Carbon nanotube - BJT, MOSFET, SIC, GAN, etc.
- Nanowire - IC chip
Energy efficiency and lighting Organic material and device
- LED/AMOLED - Electronic ink
- Photovoltaic/solar cell - Printed electronics
- Battery, DC-DC converter
Passive component, sensor Material property analysis
- Resistor, rheostat, thermistor, switch - Resistivity
- Photoelectric sensor, sensor - Hall effect
- Graphene - Diode, Zener diode, LED, laser diode
- Carbon nanotube - BJT, MOSFET, SIC, GAN, etc.
- Nanowire - IC chip
Energy efficiency and lighting Organic material and device
- LED/AMOLED - Electronic ink
- Photovoltaic/solar cell - Printed electronics
- Battery, DC-DC converter
Passive component, sensor Material property analysis
- Resistor, rheostat, thermistor, switch - Resistivity
- Photoelectric sensor, sensor - Hall effect
Product Advantages
I-V characteristics
Usually, I-V characterization of a DUT requires the use of highly sensitive ammeter, voltmeter, voltage source, and current source. The process of programming, synchronizing, connecting, measuring, and analyzing each of these instruments is complex, time-consuming, and takes up excessive test bench space. N2600 series can greatly simplify the test process and reduce test bench space occupation. N2600 provides 4-quadrant operation. When operating in 1st and 3rd quadrant, N2600 acts as a power source to output power to the DUT. When operating in 2nd and 4th quadrant, N2600 acts as a sink (load) to absorb energy. In source or sink mode, N2600 can measure voltage, current, and resistance, making it an ideal selection for I-V characterization of DUT, such as material research, electronics, semiconductor, etc.
Four-quadrant operation as source or load
Four quadrants: The power quadrant refers to the quadrant diagram formed with voltage as X-axis and current as Y-axis. In the first and third quadrants, voltage and current go same direction, and SMU supplies power to DUT, which is called the source mode.In the second and fourth quadrants, voltage and current go reverse direction, DUT discharges to SMU, and SMU passively absorbs the incoming current and provides a return path for the current, which is called the sink mode.
Linear staircase sweep and logarithmic staircase sweep
N2600 supports linear staircase sweep and logarithmic staircase sweep modes. The sweep mode runs automatically after setting the functional relation and protection point, which greatly speeds up the test efficiency. The two basic sweep waveform can be set up to single-event or continuous operation, making N2600 ideal for I/V, I/R, V/I, and V/R characterization.
- Linear staircase sweep:sweep from start level to end level in equal linear steps
- Logarithmic staircase sweep: sweep on a log scale with a specified number of steps per decade
2/4/6-wire resistance measurement
N2600 SMU integrates a high-precision digital multimeter function, which not only supports high-precision voltage and current measurement, but also supports 2/4/6-wire resistance measurement, which is suitable for various test scenarios.
2-wire resistance measurement is suitable for test scenarios where the resistance of the test leads is much smaller than the resistance to be measured, regardless of the voltage drop loss caused by the test leads.
4-wire resistance measurement is suitable for measuring low-value resistances. N2600 SMU has an auto-correction function that eliminates test lead effects.
6-wire resistance measurement: When the measured resistance is connected in parallel with other resistances, the other resistances will shunt and affect the test. N2600 SMU uses 6-wire resistance measurement to enable in-situ measurement of resistors on the PCB.
4-wire resistance measurement is suitable for measuring low-value resistances. N2600 SMU has an auto-correction function that eliminates test lead effects.
6-wire resistance measurement: When the measured resistance is connected in parallel with other resistances, the other resistances will shunt and affect the test. N2600 SMU uses 6-wire resistance measurement to enable in-situ measurement of resistors on the PCB.
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